EPC2LC20N Datasheet, PDF (19/26 Pages) Altera Corporation – Configuration Devices for SRAM-Based LUT Devices

Operating Conditions
Page 19
Operating Conditions
Table 12 through Table 19 list information about absolute maximum ratings,
recommended operating conditions, DC operating conditions, and capacitance for
configuration devices.
Table 12. Absolute Maximum Ratings ⁽¹⁾
Symbol
V_CC
V_I
I_MAX
I_{O UT}
P_D
T_STG
T_AMB
T_J
Parameter
Supply voltage
DC input voltage
DC V_CC or GND current
DC output current, per pin
Power dissipation
Storage temperature
Ambient temperature
Junction temperature
Conditions
With respect to GND ⁽²⁾
With respect to GND ⁽²⁾
—
—
—
No bias
Under bias
Under bias
Min
Max
Unit
–2.0
7.0
V
–2.0
7.0
V
—
50
mA
–25
25
mA
—
250
mW
–65
150
°C
–65
135
°C
—
135
°C
Table 13. Recommended Operating Conditions
Symbol
Parameter
Conditions
Supply voltage for 5.0-V operation ⁽³⁾, ⁽⁴⁾
V_CC
Supply voltage for 3.3-V operation ⁽³⁾, ⁽⁴⁾
V_I
Input voltage
V_O
Output voltage
T_A
Operating temperature
t_R
Input rise time
t_F
Input fall time
With respect to GND
—
For commercial use
For industrial use
—
—
Min
Max
Unit
4.75
(4.50)
5.25
(5.50)
V
3.0 (3.0) 3.6 (3.6)
V
–0.3
V_CC + 0.3
(5)
V
0
V _CC
V
0
70
°C
–40
85
°C
—
20
ns
—
20
ns
Table 14. DC Operating Conditions
Symbol
Parameter
Conditions
V_IH
High-level input voltage
—
V_IL
Low-level input voltage
—
5.0-V mode high-level TTL output
voltage
I_OH = –4 mA DC ⁽⁶⁾
V_{O H}
3.3-V mode high-level CMOS
output voltage
I_OH = –0.1 mA DC ⁽⁶⁾
V_{O L}
Low-level output voltage
I_OL = 4 mA DC ⁽⁶⁾
I_I
Input leakage current
V_I = V_CC or GND
I_{O Z}
Tri-state output off-state current V_O = V_CC or GND
Min
Max
Unit
2.0
V_CC + 0.3
(5)
V
–0.3
0.8
V
2.4
—
V
V_CC – 0.2
—
V
—
0.4
V
–10
10
A
–10
10
A
January 2012 Altera Corporation
Configuration Devices for SRAM-Based LUT Devices