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A1369 Datasheet, PDF (8/22 Pages) Allegro MicroSystems – Customer Programmable Linear Hall-Effect Sensor
A1369
Customer Programmable Linear Hall-Effect Sensor
Optimized for Use in Current Sensing Applications
its quiescent value. This proportionality is specified as the mag-
netic sensitivity, Sens (mV/G), of the device and is defined as:
Sens
=
VOUT(B+)
B+
–
–
VOUT(B–)
B–
where B+ and B- are two magnetic fields with opposite polarities.
Guaranteed Sensitivity Range. The magnetic sensitivity can be
programmed around its nominal value within the sensitivity range
limits, Sens(max) and Sens(min). Refer to the section on guaranteed
quiescent voltage output range for a conceptual explanation.
Average Sensitivity Step Size. Refer to the section on average
quiescent voltage output step size for a conceptual explanation.
Sensitivity Programming Resolution. Refer to the section on
quiescent voltage output programming resolution for a conceptual
explanation.
Sensitivity Temperature Coefficient. The device sensitivity
changes over temperature with respect to its sensitivity tem-
perature coefficient, TCSENS. TCSENS is programmed at 85ºC,
and calculated relative to the nominal sensitivity programming
temperature of 25ºC. TCSENS (%/ºC) is defined as:
( )( ) TCSENS =
SensT2 – SensT1
SensT1
×
100%
1
T2 – T1
where T1 is the nominal Sens programming temperature of 25ºC,
and T2 is the TCSENS programming temperature of 85ºC.
The ideal value of sensitivity over temperature, SensIDEAL(TA), is
defined as:
SensIDEAL(TA) = SensT1 × (100% + TCSENS(TA – T1))
Guaranteed Sensitivity Temperature Coefficient Range. The
magnetic sensitivity temperature coefficient can be programmed
within its limits of TCSens(max) and TCSens(min). Refer to the sec-
tion on guaranteed quiescent voltage output range for a concep-
tual explanation.
Average Sensitivity Temperature Coefficient Step Size. Refer
to the section on average quiescent voltage output step size for a
conceptual explanation.
sensitivity temperature coefficient effects cause the magnetic
sensitivity to drift from its ideal value over the operating ambi-
ent temperature, TA. For purposes of specification, the sensitivity
drift through temperature range, ΔSensTC, is defined:
DSensTC –
SensTA – SensIDEAL(TA)
SensIDEAL(TA)
×
100%
Sensitivity Drift Due to Package Hysteresis. Package stress
and relaxation can cause the device sensitivity at TA = 25ºC to
change during/after temperature cycling. This change in sensitiv-
ity follows a hysteresis curve. For purposes of specification, the
sensitivity drift due to package hysteresis, ΔSensPKG, is defined:
( ) DSensPKG =
Sens(25ºV, 2) – Sens(25ºC, 1)
Sens(25ºC, 1)
× 100%
where Sens(25ºC ,1) is the programmed value of sensitivity at TA =
25ºC, and Sens(25ºC ,2) is the value of sensitivity at TA = 25ºC after
temperature cycling TA up to 85ºC, down to – 40ºC, and back to
up 25ºC.
Linearity Sensitivity Error. The A1369 is designed to provide
linear output in response to a ramping applied magnetic field.
Consider two magnetic fields, B1 and B2. Ideally the sensitivity
of a device is the same for both fields for a given supply voltage
and temperature. Linearity error is present when there is a differ-
ence between the sensitivities measured at B1 and B2.
Linearity Error is calculated separately for the positive (LinERR+)
and negative (LinERR-) applied magnetic fields. Linearity error
(%) is measured and defined as:
( ) LinERR+ =
1 – SensB++
SensB+
× 100%
( ) LinERR- =
1 – SensB--
SensB-
× 100%
LinERR = max(|LinERR+|,|LinERR-|)
where
( ) SensBx =
|V – V | OUTBx
OUT(Q)
Dx
Sensitivity Temperature Coefficient Programming Resolu-
tion. Refer to the section on quiescent voltage output program-
ming resolution for a conceptual explanation.
Sensitivity Drift Through Temperature Range. Second order
and B++, B+, B--, and B- are positive and negative magnetic fields
with respect to the quiescent voltage output such that |B++| > |B+|
and |B--| > |B-|.
Allegro MicroSystems, LLC
8
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com