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| CQ-3203 Datasheet, PDF (17/19 Pages) Asahi Kasei Microsystems – High-Speed Response Coreless Current Sensor | |||
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[CQ-3203]
14. Reliability Tests
Table 7. Test parameters and conditions of reliability tests.
No.
Test Parameter
Test Conditions
n
1
High Humidity Bias Test
[JEITA EIAJ ED-4701 102]
Ta = 85ï°C, 85%RH, continuous operation
22
[JEITA EIAJ ED-4701 101]
2 High Temperature Bias Test
Ta = 125ï°C, continuous operation
22
3
High Temperature Storage Test
[JEITA EIAJ ED-4701 201]
Ta = 150ï°C
22
4
Low Temperature Storage Test
[JEITA EIAJ ED-4701 202]
Ta = â65ï°C
22
[JEITA EIAJ ED-4701 105]
5
Heat Cycle Test
â65ï°C â150ï°C
30min. â 30min.
22
Tested in vapor phase
Test Time
1000h
1000h
1000h
1000h
100 cycles
Tested samples are pretreated as below before each reliability test:
Desiccation: 125ï°C/24h â Moisture Absorption: 60ï°C/60%RH/120h â Reflow: 3 times (JEDEC Level2a)
Criteriaï¼
Products whose drifts before and after the reliability tests do not exceed the values below are considered
to be in spec.
Sensitivity Vh (Ta=35ï°C)
: Within ±1.5%
Zero-current output Voltage Vof (Ta=35ï°C) : Within ±66.0mV
Linearity Ï (Ta=35ï°C)
: Within ±1%F.S.
EEPROM data
: Unchanged
016008766-E-00
- 17 -
2016/07
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