English
Language : 

AIC3412 Datasheet, PDF (3/9 Pages) Analog Intergrations Corporation – Low IQ High Light Load Efficiency
AIC3412
 ELECTRICAL CHARACTERISTICS
(Typical application circuit, and the ambient temperature=25°C, VIN=1.2V, VOUT=3.3V, unless
otherwise specified) (Note1)
PARAMETER
Output Voltage Range
Minimum Start Up Voltage
Input Operation Voltage
UVLO of Vin
Quiescent Current (PSM)
IC Shut Down Current
Feedback Voltage
FB Input Leakage Current
Inductor current ripple
Constant off time
Line Regulation
Load Regulation
NMOS Switch Leakage
PMOS Switch Leakage
NMOS Switch On Resistance
PMOS Switch On Resistance
SHDN High Threshold Voltage
SHDN Low Threshold Voltage
SHDN Pin Input Current
NMOS Current Limit
Over Temperature Protection
Over Temperature Hysteresis
TEST CONDITION
RL= 3.3kOhm
Vin decreasing
VOUT
VIN=1.2V, VOUT=3.3V,
VFB=0.55V (Note 2)
SHDN = 0V, VOUT =1.1V
VFB=1.3V
VIN=1.2V, VOUT=3.3V
VIN<VOUT (Note 3)
VIN<VOUT (Note 3)
VSW=5V
VSW=5V, VOUT=0V
VIN=1.2V, VOUT=3.3V
VIN=1.2V, VOUT=3.3V
VIN=1.2V
VIN=1.2V
SHDN = 5.5V
VIN=1.2V, VOUT=3.3V
SYMBOL MIN TYP MAX
VOUT 1.65
5.5
0.75 0.9
0.7
5
0.5 0.7
IQ
ISD
VFB
IFB
ILH
TOFF
ISHDN
12 25
0.01 1
490 500 510
1
50
200
400
0.5%
0.5%
0.1 5
0.1 10
480
800
0.8
0.2
0.01 1.0
0.28 0.48 0.68
150
30
UNIT
V
V
V
V
μA
μA
mV
nA
mA
ns
μA
μA
mΩ
mΩ
V
V
μA
A
°C
°C
Note 1: Specifications are production tested at TA=25°C. Specifications over the -40°C to 85°C operating tem-
perature range are assured by design, characterization and correlation with Statistical Quality Controls
(SQC).
Note 2: The test circuit shown in Fig. 2.
Note 3: Guarantee by Design.
3