BTK1A Datasheet, PDF (13/18 Pages) Agere Systems – Dual Differential Transceivers BTK1A and BTM1A

Data Sheet
October 2001
Dual Differential Transceivers
BTK1A and BTM1A
Latch-Up
Latch-up evaluation has been performed on the data transmission receivers. Latch-up testing determines if the
power-supply current exceeds the specified maximum due to the application of a stress to the device under test. A
device is considered susceptible to latch-up if the power supply current exceeds the maximum level and remains at
that level after the stress is removed.
Agere performs latch-up testing per an internal test method which is consistent with JEDEC Standard No. 17
(previously JC-40.2) CMOS Latch-Up Standardized Test Procedure.
Latch-up evaluation involves the following three separate stresses to evaluate latch-up susceptibility levels:
1. dc current stressing of input and output pins.
2. Power supply slew rate.
3. Power supply overvoltage.
Table 10. Latch-Up Test Criteria and Test Results
Data Transmission
Receiver ICs
Minimum Criteria
Test Results
dc Current Stress
of I/O Pins
≥150 mA
≥250 mA
Power Supply
Slew Rate
≤1 µs
≤100 ns
Power Supply
Overvoltage
≥1.75 x Vmax
≥2.25 x Vmax
Based on the results in Table 10, the data transmission receivers pass the Agere latch-up testing requirements and
are considered not susceptible to latch-up.
Agere Systems Inc.
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