UT54ACTQ16374 Datasheet, PDF (8/14 Pages) Aeroflex Circuit Technology – RadHard CMOS 16-bit D Flip-Flop TTL Inputs, and Three-State Outputs

AC ELECTRICAL CHARACTERISTICS¹
(V_DD = 5V 10%, -55C < T_C < +125C)
SYMBOL
PARAMETER
MIN
MAX UNIT
t_PLH
Propagation delay CPn to On
2
10
t_PHL
Propagation delay CPn to On
2
10
t_PZL
Output enable time OEn to On
2
9.0
t_PZH
Output enable time OEn to On
2
9.0
t_PLZ
Output disable time OEn to On high impedance
2
9.0
t_PHZ
Output disable time OEn to On high impedance
2
9.0
t_FMAX2 ^{Maximum clock frequency}
100
t_S
Setup time high or low In to CPn
1.5
t_H
Hold time high or low In from CPn
0.5
t_W
Clock pulse, high or low CPn
5.0
t_SKEW3 ^{Output-to-output skew}
1.25
t_DSKEW3 ^{Differential skew between outputs}
1.5
t_DSKEWPP3,5
Part-to-part output skew between outputs on multiple devices under
identical system conditions.
500
Notes:
1. All specifications valid for radiation dose  1E5 rad(Si) per MIL-STD-883, Method 1019.
2. Verified by functional testing.
3. Output skew is defined as a comparison of any two output transitions high-to-low vs. high-to-low and low-to-high vs low-to-high.
4. Differential skew is defined as a comparison of any two output transitions high-to-low vs. low-to-high and low-to-high vs high-to low.
5. Guaranteed by characterization, but not tested.
Test Load or Equivalent¹
V_DD
V_DD
100
•
40pF
•
100
ns
ns
ns
ns
ns
ns
MHz
ns
ns
ns
ns
ns
ps
Notes
1. Equivalent test circuit means that DUT performance will be correlated and remain guaranteed to the applicable test circuit, above, whenever a test platform
change necessitates a deviation from the applicable test circuit.
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