UT54ACS109 Datasheet, PDF (2/6 Pages) Aeroflex Circuit Technology – Radiation-Hardened Dual J-K Flip-Flops

LOGIC DIAGRAM
UT54ACS109/UT54ACTS109
PRE
Q
CLK
J
Q
K
CLR
RADIATION HARDNESS SPECIFICATIONS ¹
PARAMETER
Total Dose
SEU Threshold ²
SEL Threshold
Neutron Fluence
LIMIT
1.0E6
80
120
1.0E14
UNITS
rads(Si)
MeV-cm²/mg
MeV-cm²/mg
n/cm²
Notes:
1. Logic will not latchup during radiation exposure within the limits defined in the table.
2. Device storage elements are immune to SEU affects.
ABSOLUTE MAXIMUM RATINGS
SYMBOL
PARAMETER
LIMIT
UNITS
V_DD
Supply voltage
-0.3 to 7.0
V
V_I/O
Voltage any pin
-.3 to V_DD +.3
V
T_STG
T_J
Storage Temperature range
Maximum junction temperature
-65 to +150
C
+175
C
T_LS
Lead temperature (soldering 5 seconds)
+300
C
JC
Thermal resistance junction to case
20
C/W
I_I
DC input current
10
mA
P_D
Maximum power dissipation
1
W
Note:
1. Stresses outside the listed absolute maximum ratings may cause permanent damage to the device. This is a stress rating only, functional operation of the device
at these or any other conditions beyond limits indicated in the operational sections is not recommended. Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
RadHard MSI Logic
62