STI1000 Datasheet, PDF (1/4 Pages) Aeroflex Circuit Technology – Synthetic Test Systems

Synthetic Test Systems
STI1000 Satellite Payload Test Instrument
STI1000 is a synthetic microwave test system configured for testing satellite
payloads in factory environments.
• 1 Million Samples per Second
• 20 Thousand Frequencies per Second
• Real-Time DSP Produces Results Fast
• Test Integration Reduces Data
Requirements
• Calibration Plane Moved to the Payload
• Real-Time Calibration While Connected
• Imbedded Functional Tests
• Frequency Coverage of All Satellite Bands
• Synthetic Architecture
• “Programmable Firmware”
• WAN and LAN Support
• Multiple Satellite Interconnect Points
• Open-Architecture for Easy Upgrades
• Full Range of Communications Tests
• Analog or Digital Modulation Schemes
Satellite Payload Test Instrument
The STI 1000 is a synthetic microwave test system optimized for test-
ing satellite payloads in a factory setting. The STI 1000 can be used
either as a stand-alone instrument or controlled by an external net-
work as part of enterprise-wide factory automation. The STI 1000 is
designed to dramatically improve integrated payload test times and
reduce measurement errors introduced by either the operator or the
test hardware. Through its digitally synthesized stimulus and
response system design, the STI 1000 can easily be configured both in
hardware and software to meet specific user requirements.
HARDWARE
The STI 1000 hardware architecture is based on advanced synthetic
instrument concepts. Through the use of this flexible design, the STI
1000 replaces and replicates several microwave test instruments
including: a microwave power meter, a frequency counter, multiple
sources, a spectrum analyzer, a vector network analyzer, a noise figure
meter and an intermodulation analyzer. All of these instruments are
represented by the STI 1000. A basic STI 1000 includes several stim-
ulus generators and a fast
Synthesis
Up
Conversion
response measurement
channel. Options can
include the addition of
DUT
Interface
arbitrary waveform gener-
ators for complex analog
Instrument
Control
Calibration/
SFT
Device
Under Test
or digital modulation
waveforms, telemetry and
control paths and multi-
DUT
Interface
ple response channels. An
innovative calibration
design allows for the cali-
Digitization
Down
Conversion
bration plane to be
extended beyond the
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