5962-8982401PA Datasheet, PDF (9/16 Pages) Analog Devices – High Precision 5 V Reference

5V
50mV
1µS
V_L
V_OUT
C_L = 0
5V
200mV
AD586
1µS
C_L = 1000pF
Figure 13. Large-Scale Transient Response
5V
1mV
2µS
V_L
V_OUT
Figure 14. Fine-Scale Setting for Transient Load
In some applications, a varying load may be both resistive and
capacitive in nature, or the load may be connected to the AD586
by a long capacitive cable.
Figure 15 and Figure 16 display the output amplifier
characteristics driving a 1000 pF, 0 mA to 10 mA load.
3.5V
AD586
C_L
1000pF
V_L
500Ω
5V
0V
V_OUT
Figure 15. Capacitive Load Transient Response Test Circuit
Figure 16. Output Response with Capacitive Load
LOAD REGULATION
The AD586 has excellent load regulation characteristics. Figure 17
shows that varying the load several mA changes the output by a
few µV. The AD586 has somewhat better load regulation per-
formance sourcing current than sinking current.
∆V_OUT (µV)
–6 –4 –2
1000
500
2 4 6 8 10 LOAD (mA)
0
–500
–1000
Figure 17. Typical Load Regulation Characteristics
TEMPERATURE PERFORMANCE
The AD586 is designed for precision reference applications
where temperature performance is critical. Extensive tempera-
ture testing ensures that the device maintains a high level of
performance over the operating temperature range.
Some confusion exists with defining and specifying reference
voltage error over temperature. Historically, references have
been characterized using a maximum deviation per degree
Celsius, that is, ppm/°C. However, because of nonlinearities in
temperature characteristics that originated in standard Zener
references (such as “S” type characteristics), most manufacturers
have begun to use a maximum limit error band approach to
specify devices. This technique involves measuring the output at
three or more different temperatures to specify an output volt-
age error band.
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