OP162_05 Datasheet, PDF (6/20 Pages) Analog Devices – 15 MHz Rail-to-Rail Operational Amplifiers

OP162/OP262/OP462
ABSOLUTE MAXIMUM RATINGS
Table 4.
Parameter
Supply Voltage
Input Voltage¹
Differential Input Voltage²
Internal Power Dissipation
SOIC (S)
MSOP (RM)
TSSOP (RU)
Output Short-Circuit Duration
Storage Temperature Range
Operating Temperature Range
Junction Temperature Range
Lead Temperature Range
(Soldering, 10 sec)
Min
±6 V
±6 V
±0.6 V
Observe Derating Curves
Observe Derating Curves
Observe Derating Curves
Observe Derating Curves
–65°C to +150°C
–40°C to +125°C
–65°C to +150°C
300°C
1 _{For supply voltages greater than 6 V, the input voltage is limited to less than}
or equal to the supply voltage.
2 _{For differential input voltages greater than 0.6 V, the input current should be}
limited to less than 5 mA to prevent degradation or destruction of the input
devices.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operation section
of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Table 5.
Package Type
θJA1
8-Lead SOIC (S)
157
8-Lead TSSOP (RU)
208
8-Lead MSOP (RM)
190
14-Lead SOIC (S)
105
14-Lead TSSOP (RU)
148
____________________________
θJC
Unit
56 °C/W
°C/W
44 °C/W
°C/W
°C/W
1 _{θJA is specified for the worst-case conditions, that is, θJA is specified for a}
device soldered in circuit board for SOIC, MSOP, and TSSOP packages.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Rev. F | Page 6 of 20