OP27 Datasheet, PDF (5/16 Pages) Analog Devices – Low-Noise, Precision Operational Amplifier

DICE CHARACTERISTICS
OP27
1. NULL
2. (–) INPUT
3. (+) INPUT
4. V–
6. OUTPUT
7. V+
8. NULL
DIE SIZE 0.109 ؋ 0.055 INCH, 5995 SQ. MILS
(2.77 ؋ 1.40mm, 3.88 SQ. mm)
WAFER TEST LIMITS (@ V_S = ±15 V, T_A = 25؇C unless otherwise noted.)
Parameter
Symbol Conditions
OP27N
Limit
OP27G
Limit
OP27GR
Limit
Unit
INPUT OFFSET VOLTAGE*
V_OS
35
60
100
µV Max
INPUT OFFSET CURRENT
I_OS
INPUT BIAS CURRENT
IB
35
50
75
nA Max
± 40
± 55
± 80
nA Max
INPUT VOLTAGE RANGE
IVR
± 11
± 11
± 11
V Min
COMMON-MODE REJECTION
RATIO
CMRR
V_CM = IVR
114
POWER SUPPLY
PSRR
V_S = ± 4 V to ± 18 V
10
106
100
dB Min
10
20
µV/V Max
LARGE-SIGNAL VOLTAGE
GAIN
A_VO
A_VO
OUTPUT VOLTAGE SWING V_O
V_O
R_L ≥ 2 kΩ, V_O = ± 10 V
R_L ≥ 600 Ω, V_O = ± 10 V
R_L ≥ 2 kΩ
RL2600n
1000
800
± 12.0
± 10.0
1000
800
± 12.0
± 10.0
700
600
+11.5
± 10.0
V/mV Min
V/mV Min
V Min
V Min
POWER CONSUMPTION
P_d
V_O = 0
140
140
170
mW Max
NOTE
*Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.
REV. A
–5–