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OP-41_15 Datasheet, PDF (5/11 Pages) Analog Devices – LOW BIAS CURRENT HIGH STABILITY JFET OPERATIONAL AMPLIFIER
- ANALOGDEVICES fAX-ON-DEMAND HOTLINE
Page 6
DICE CHARACTERISTICS
OP-41
1. OFFSET VOLTAGE NULL
2. INVERTING INPUT
3. NONINVERTING INPUT
4. NEGATIVE SUPPLY
5. OFFSET VOLTAGENULL
6. AMPLIFIER OUTPUT
7. POSITIVE SUPPLY
DIE SIZE 0.103 X 0.074 Inch, 7622 sq. mils
(2.62 X 1.B8mm, 4.92 sq. mm)
= WAFER TEST LIMITS at Vs :::I::1Sv,~A = 25°C. unless otherwise noted.
OPARAMETER
SYMBOL
CONDITIONS
OP-41N
LIMIT
UNITS
B Offset Voltage
Vos
S Bias Current
---..------_..
Ie
O Open-Loop Voltage Gain
AvO
O--u--t-p-u--t----V--o--l.t..a.-g-e----S--w--i-n--g-..-------..--.---- Vo
L Supply Current
ISY
E Input Voltage Range
IVR
T Common-Mode
E Aejection
CMR
(Note 1)
RL "2kO
RL =2kO
Vo =OV
(Note 2)
= VCM ::t_11V
1000
----------....-..-----------------------
20
500
-------------
-:-t-1--2---------
------------------------..---------------
-----------------------
1_2
:t11
----------------------------------------
!-'VMAX
pA MAX
V/mV MIN
VMIN
mA MAX
mV_M._IN-
90
dB MIN
m
m
m___-
Power Supply
Rejection Ratio
---------.--....------.-----------.------
Short Circuit
----O--utput Current
PSRR
'sc
VS~:t10Vto:t18V
,,------
Short Circuit to Ground
80
" "-"
:1:6
-1::36
jJ.VIVMAX
-,,-----------------
mA MIN
mA MAX
--S-l-e--w Rate
SA
------..-------
--------------------
--------- VIps MIN
Capacitive Load
Stability
Av =+1
(Note 3)
----------
250
pF MIN
NOTES:
1, VCM" 0
2, Guaranteed by CMA test.
3- Guaranteed but not tested.
Electrical tests are performed at wafer probe to the limits shown- Dueto variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing-
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