OP470 Datasheet, PDF (4/16 Pages) Analog Devices – Very Low Noise Quad Operational Amplifier

OP470–SPECIFICATIONS
WAFER TEST LIMITS (at V_S = ؎15 V, 25؇C, unless otherwise noted.)
Parameter
Symbol
Conditions
OP470GBC
Limit
Unit
INPUT OFFSET VOLTAGE V_OS
0.8
mV Max
INPUT OFFSET CURRENT I_OS
V_CM = 0 V
20
nA Max
INPUT BIAS CURRENT
I_B
V_CM = 0 V
50
nA Min
LARGE-SIGNAL
Voltage Gain
V_O = ± 10 V
A_VO
R_L = 10 kW
R_L = 2 kW
800
V/mV Min
400
INPUT VOLTAGE RANGE* IVR
± 11
V Min
OUTPUT VOLTAGE SWING V_O
R_L ≥ 2 kW
± 12
V Min
COMMON-MODE
REJECTION
CMR
V_CM = ± 11 V
100
dB
POWER SUPPLY
REJECTION RATIO
PSRR
V_S = ± 4.5 V to ± 18 V
5.6
mV/V Max
SUPPLY CURRENT
(All Amplifiers)
I_SY
No Load
11
mA Max
NOTE
*Guaranteed by CMR test
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaran-
teed for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.
–4–
REV. B