OP221 Datasheet, PDF (4/12 Pages) Analog Devices – Dual Low Power Operational Amplifier, Single or Dual Supply

OP221–SPECIFICATIONS (Matching Characteristics at Vs = ؎15 V, –55؇C ≤ TA ≤ +125؇C for OP221A,
–25؇C ≤ T_A ≤ +85؇C for OP221E, –40؇C ≤ T_A ≤ +85؇C for OP221G, unless otherwise noted.
Grades E and G are sample tested.)
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OP221A/E
OP221G
Parameter
Symbol Conditions
Min Typ Max
Min Typ Max Unit
Input Offset
Voltage Match
∆V_OS
Average Noninverting I_B+
Bias Current
V_CM = 0
100 400
100
400 800
µV
140 nA
Input Offset
Voltage Tracking
IC∆V_OS
1
2
3
5
µV°C
Noninverting Input I_OS+
Offset Current
V_CM = 0
3
7
6
12
nA
Common-Mode
Rejection Ratio
Match (Note 1)
∆CMRR V_CM = –15 V to 13.2 V
87
90
72
80
dB
Power Supply
Rejection Ratio
Match (Note 1)
∆PSRR
26
140 µV/V
NOTES
1_{∆CMRR is 20 log10 VCM/∆CME, where VCM is the voltage applied to both noninverting inputs and ∆CME is the difference in common-mode input-referred error.}
2_{∆PSRR is: Input-Referred Differential Error}
∆V_S
Wafer Test Limits at V_s = ؎2.5 V to ؎15 V, T_A = 25؇C, unless otherwise noted.
.
Parameter
Symbol
Conditions
OP221N
Limit
Unit
Input Offset Voltage
V_OS
200
µV Max
Input Offset Current
I_OS
V_CM = 0
3.5
nA Max
Input Bias Current
I_B
V_CM = 0
85
nA Max
Input Voltage Range
Common-Mode
Rejection Ratio
Power Supply
Rejection Ratio
IVR
CMRR
PSRR
V+ = 5 V, V– = 0 V
V_S= ± 15 V
V– = 0 V, V+ = 5 V,
0 V ≤ V_CM ≤ 3.5 V
V_S = ± 15 V
–15 V ≤ V_CM ≤ 13.5 V
V_S = ± 2.5 V to ± 15 V
V– = 0 V, V+ = 5 V to 30 V
0/3.5
–15/13.5
88
93
12.5
22.5
V Min/Max
V Min
dB Min
V/mV Min
Large-Signal
Voltage Gain
Avo
V_S = ± 15 V
R_L = 10 kΩ
1500
V/mV Max
Output Voltage Swing
V_O
V+ = 5 V, V– = 0 V, R_L= 10 kΩ
V_S = 15 V, R_L = 10 kΩ
0.7/4.1
± 13.8
V Min/Max
V Min
Supply Current
I_SY
(Both Amplifiers)
V_S = ± 2.5 V, No Load
V_S = ± 15 V, No Load
560
µA Max
810
NOTE
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.
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REV. A