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OP-44_15 Datasheet, PDF (4/9 Pages) Analog Devices – HIGH SPEED PRECISION OPERATIONAL AMPLIFIER
jPMI) OP-44 HIGH-SPEED, PRECISION OPERATIONAL AMPLIFIER
DICE CHARACTERISTICS
t
1. OFFSET VOLTAGE NULL
2. INVERTING INPUT
3. NONINVERTING INPUT
4. NEGATIVE SUPPLY
5. OFFSET VOLTAGE NULL
6. AMPLIFIER OUTPUT
7. POSITIVE SUPPLY
DIE SIZE 0.098 X 0.070 inch, 6860 sq. mils
(2.49 X 1.78 mm, 4.43 sq. mm)
For additional DICE ordering information, refer
to 1988 Data Book, Section 2.
OBSOLETE WAFER TEST LIMITS at Vs =::t15V,1)= 25°C, unless otherwise noted.
PARAMETER
Offset Voltage
Input Bias Current
Input Offset Current
Input Voltage Range
Common-Mode Rejection
Power-Supply
Rejection Ratio
Large-Signal
Voltage Gain
SYMBOL
Vas
18
10S
IVR
CMR
PSRR
Ava
CONDITIONS
VCM = OV
VCM = OV
(Note 1)
VCM = :1:11V
Vs = :1:10V to :1:20V
RL = 10k!l
RL = 2k!l
RL=1k!l
OP-44N
LIMIT
1.5
250
50
:1:11
80
50
500
200
100
UNITS
mVMAX
pA MAX
pA MAX
V MIN
dB MIN
p.V/VMAX
VlmV MIN
Output Voltage Swing
Va
RL = 1k!l
:1:11.5
V MIN
Output
Current
lOUT
:1:20
mAMIN
Supply Current
ISY
Slew Rate
SR
Capacitive Load
CL
Drive Capability
NOTES:
1. Guaranteed
2. Guaranteed
by CMR test.
but not tested.
No Load
Va = OV
AVCL 2: 3
(Note 2)
7.5
mA MAX
80
VIp.s M I N
50
pF MIN
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.
.
.
4
10/87, Rev. 81