OP-20_15 Datasheet, PDF (4/6 Pages) Analog Devices – MICROPOWER OPERATIONAL AMPLIFIER SINGLE OR DUAL SUPPLY

ANALOGDEVICES fAX-ON-DEMAND HOTLINE - Page 28
OP-20
DICE CHARACTERISTICS
1. BALANCE
2. INVERTINGINPUT
3. NONINVERTINGINPUT
4. V-
5. BALANCE
6. OUTPUT
7. V+
DIE SIZE 0.069 X 0.047 Inch, 3174 sq. mils
OBSOLETE ^{(1.75x1.17mm,2.05 sq. mm)}
WAFER TEST LIMITS at Vs= :I:1: 5V,TA=25°C, unless otherwise noted.
PARAMETER
Input Offset Yoltage
Input Offset Current
Inpul Bias Current
Input Yoltage Range
Common-Mode
Rejection Ratio
Power Supply
SYMBOL
Yos
'os
Ie
IVR
CMRR
PSRR
CONDITIONS
Y+=+Sy, V-=OY
Vs":!:ISV
V+=+SV, V-=OV,OV:SVCM:S+3.5V
Vs = :!:15V,-15V VCM:S:!:13.5V
Vs=:!:2.5Vto:!:15V
= = V- OV, V+ +5V
Op.20N
LIMIT
300
1.5
25
0/3.5
-15/13.5
95
100
6
OP-20G
LIMIT
600
2.5
30
0/3.5
-15/13.5
90
94
10
OP-20GR
LIMIT
1000
4.0
40
0/3.5
-15/13.5
85
90
32
UNITS
jJYMAX
nA MAX
nA MAX
VMIN
dBMIN
jJ.V/V MAX
Rejection Ratio
to +3OV
Large-Signal
Voltage Gain
Output Voltage
Swing
Supply Current
= RL 25kfi
AyO
Vo=::!:10V
RL = 10kO,V+ = +5V, V- = OV
Vo
RL =25kO, Vs = ::!:15V
tSY
Vs = ::!:2.5V,No Load
Vs = ::!:15V,No Load
1000
0.7/4.1
:t14.1
55
80
800
0.8/4.1
:t 14.1
63
85
500
0.9/4.0
:t 14.0
70
95
VlmV MIN
VMjN
jJAMAX
NOTE:
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not
guaranteed for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.
TYPICAL ELECTRICAL CHARACTERISTICS at Vs= :t 15V,TA= +250C. unless otherwise noted.
PARAMETER
Average Input
Offset Voltage Drift
Large-Signal
Voltage Gain
SYMBOL
TCVos
TCVosn
CONDITIONS
Unnulled
Nulled, Rp: 10kO
AyO
RL = 25kO
OP-20N
TYPICAL
1.0
1.0
2000
OP-20G
TYPICAL
1.5
1.5
2000
OP-20GR
TYPICAL
2.5
2.5
1000
UNITS
p.V/oC
V/mV
-4-
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