ADIS16209 Datasheet, PDF (4/16 Pages) Analog Devices – High-Accuracy, Dual-Axis Digital Inclinometer and Accelerometer

ADIS16209
Preliminary Technical Data
Parameter
ON-CHIP VOLTAGE REFERENCE
Accuracy
Reference Temperature Coefficient
Output Impedance
DAC OUTPUT
Resolution
Relative Accuracy
Differential Nonlinearity
Offset Error
Gain Error
Output Range
Output Impedance
Output Settling Time
LOGIC INPUTS
Input High Voltage, VINH
Input Low Voltage, VINL
Logic 1 Input High Current, IINH
Logic 0 Input Low Current, IINL
All except RST
RST³
Input Capacitance, CIN
DIGITAL OUTPUTS
Output High Voltage, VOH
Output Low Voltage, VOL
SLEEP TIMER
Timeout Period⁴
START-UP TIME
Initial
Sleep Mode Recovery
FLASH MEMORY
Endurance⁵
Data Retention⁶
CONVERSION RATE
Maximum Throughput Rate
Minimum Throughput Rate
POWER SUPPLY
Operating Voltage Range
Power Supply Current
Conditions
At 25°C
5 kΩ/100 pF to GND
For Code 101 to Code 4095
For CS signal when used to wake up from sleep
mode
VIH = 3.3 V
VIL = 0 V
ISOURCE = 1.6 mA
ISINK = 1.6 mA
TJ = 85°C
Normal mode, SMPL_PRD ≥ 0x08, 25°C
Fast mode, SMPL_PRD ≤ 0x07, 25°C
Sleep mode, at 25°C
Min
Typ Max
2.5
−10
+10
±40
70
12
4
1
±5
±0.5
0 to
2.5
2
10
2.0
0.8
0.55
±0.2 ±10
−40 −60
−1
10
2.4
0.4
0.5
128
130
2.5
20,000
20
4096
2.066
3.0
3.3
3.6
11
14
36
42
500 750
Unit
V
mV
ppm/^oC
Ω
Bits
LSB
LSB
mV
%
V
Ω
μs
V
V
V
μA
μA
mA
pF
V
V
Seconds
ms
ms
Cycles
Years
SPS
SPS
V
mA
mA
μA
1 _{Guaranteed by iMEMS® packaged part testing, design, and/or characterization.}
2 _{Self-test response changes as the square of VDD.}
3 _{The RST pin has an internal pull-up.}
4 _{Guaranteed by design.}
5 _{Endurance is qualified as per JEDEC Standard 22 Method A117 and measured at −40°C, +25°C, +85°C, and +125°C.}
6 _{Retention lifetime equivalent at junction temperature (TJ) 55°C as per JEDEC Standard 22 Method A117. Retention lifetime decreases with junction temperature.}
Rev. PrA | Page 4 of 16