5B34 Datasheet, PDF (4/8 Pages) Analog Devices – Isolated Linearized RTD Input

Output Rise Time, 10% to 90% Span
Input-to-Output, Continuous
Output-to-Power, Continuous⁴
Transient
1 kΩ Source Imbalance, 50/60 Hz
Normal Mode Rejection 50/60 Hz
100Ω Pt, 120Ω Ni
10Ω Cu
100Ω Pt, 120Ω Ni
10Ω Cu
Continuous
Transient
Output Resistance
Voltage Output Protection
Output Selection Time
Max Logic "0"
Min Logic "1"
Max Logic "1"
Input Current "0"
Power Supply Voltage
Power Supply Current
100Ω Pt, 120Ω Ni
10Ω Cu
Mechanical Dimensions
Rated Performance
Operating
Storage
Relative Humidity
RFI Susceptibility
200 ms
Common-Mode Voltage (CMV)
1500 V rms, maximum
±3 V, maximum
ANSI/IEEE C37.90.1-1989
Common Mode Rejection (CMR)
160 dB
60 dB
Sensor Excitation Current
0.25 mA
1.0 mA
Lead Resistance Effect
±0.02°C/Ω
±0.2°C/Ω
Input Protection
240 V rms, maximum
ANSI/IEEE C37.90.1-1989
50Ω
Continuous Short to Ground
6 µs @ C_load = 0 to 2,000 pF
Output Enable Control
+1 V
+2.5 V
+36 V
0.4 mA
+5 V ±5%
30 mA
Power Supply Sensitivity, RTI
±0.05°C/V
±0.5°C/V
2.275" x 2.375" x 0.595" (57.8 mm x 59.1 mm x 15.1 mm)
Environmental
-25°C to +85°C
-40°C to +85°C
-40°C to +85°C
0 to 93% @ +40°C non-condensing
±0.5% Span error @ 400 MHz, 5 Watt, 3 ft
* ±0.025Ω For Cu RTD's; ±0.1Ω For Ni RTD's.
1 _{Rz is the value of the RTD resistance at the lowest point of the measurement range.}
2 _{Includes the combined effects of repeatability, hysteresis,}
and conformity error. Loads heavier than 50 kΩ will degrade conformity and gain temperature coefficient.
3 _{For Pt RTD's only; other types may vary.}
4 _{The output common must be kept within ±3 V of power common.}
Specifications subject to change without notice.
Rev. 0 | Page 4 of 8
5B34