AD760_15 Datasheet, PDF (3/12 Pages) Analog Devices – 16/18-Bit Self-Calibrating Serial/Byte DACPORT

AD760
NOTES
1_{For 18-bit resolution, 1 LSB = 0.00038% of FSR. For 16-bit resolution, 1 LSB = 0.0015% of FSR. For 14-bit resolution, 1 LSB = 0.006% of FSR. FSR stands for}
full-scale range and is 10 V in unipolar mode and 20 V in bipolar mode.
2_{Characteristics are guaranteed at VOUT Pin (23).}
3_{TCAL is the calibration temperature.}
4_{Gain Error is measured with a fixed 50 resistor as shown in Figure 5a and Figure 6a.}
5_{Gain Error and gain drift are measured with the internal reference. The internal reference is the main contributor to the gain drift. If lower drift is required, the}
AD760 can be used with a precision external reference such as the AD587, AD586 or AD688.
6_{DAC Gain Error is measured without the on-chip voltage reference. It represents the performance that can be obtained with an external precision reference.}
7_{External current is defined as the current available in addition to that supplied to REF IN and SPAN/BIPOLAR OFFSET on the AD760.}
8_{Operation on ±12 V supplies is possible using an external reference such as the AD586 and reducing the output range. Refer to the Internal/External Reference}
section.
Specifications subject to change without notice.
AC PERFORMANCE CHARACTERISTICS With the exception of Total Harmonic Distortion + Noise and Signal-to-Noise
Ratio, these characteristics are included for design guidance only and are not subject to test. THD+N and SNR are 100% tested. (T_MIN < T_A
< T_MAX, V_CC = +15 V, V_EE = –15 V, V_LL = +5 V, tested at V_OUT except where noted.)
Parameter
Limit Units
Output Settling Time
(Time to +0.0008% FS, with
2 k , 1000 pF Load)
13
µs max
8
µs typ
10
µs typ
6
µs typ
8
µs typ
2.5 µs typ
MUX_OUT Recovery Time
(Time to +0.0008% FS, with
100 pF Load)
2
µs typ
Total Harmonic Distortion + Noise
A, S Grade
A, S Grade
A, S Grade
0.005 % max
0.03 % max
3.0 % max
Signal-to-Noise Ratio
94
dB min
Digital-to-Analog Glitch Impulse
15
nV-s typ
MUX_OUT Glitch Impulse
Digital Feedthrough
30
nV-s typ
2
nV-s typ
Output Noise Voltage Density (1 kHz–1 MHz) 120 nV/ Hz typ
Reference Noise (1 kHz–1 MHz)
125 nV/ Hz typ
Specifications are subject to change without notice.
Test Conditions/Comments
20 V Step, T_A = +25°C
20 V Step, T_A = +25°C
20 V Step
10 V Step, T_A = +25°C
10 V Step
1 LSB Step
Recovery time is referenced to the rising edge of CALOK,
when MUX_OUT switches from MUX_IN to V_OUT.
MUX_IN = V_OUT prior to calibration.
MUX_IN, V_OUT = –10 V to +10 V
0 dB, 1001 Hz. Sample Rate = 100 kHz. T_A = +25°C
–20 dB, 1001 Hz. Sample Rate = 100 kHz. T_A = +25°C
–60 dB, 1001 Hz. Sample Rate = 100 kHz. T_A = +25°C
T_A = +25°C, byte load
DAC alternately loaded with 8000_H and 7FFF_H
100 pF Load. MUX_IN = V_OUT = negative full scale
DAC alternately loaded with 0000_H and FFFF_H. CS high
Measured at V_OUT, 20 V span, excludes internal reference
Measured at REF OUT
REV. A
–3–