AD9514 Datasheet, PDF (27/28 Pages) Analog Devices – 1.6 GHz Clock Distribution IC, Dividers, Delay Adjust, Three Outputs

PHASE NOISE AND JITTER MEASUREMENT SETUPS
WENZEL
OSCILLATOR
EVALUATION BOARD
AD9514
CLK1
OUT1
OUT1B
TERM
TERM
ZFL1000VH2
AMP
+28dB
ATTENUATOR
–12dB
AD9514
SIG IN
SPLITTER
ZESC-2-11
0°
EVALUATION BOARD
AD9514
CLK1
OUT1
OUT1B
TERM
TERM
ZFL1000VH2
AMP
+28dB
ATTENUATOR
–7dB
VARIABLE DELAY
COLBY PDL30A
0.01ns STEP
TO 10ns
Figure 41. Additive Phase Noise Measurement Configuration
WENZEL
OSCILLATOR
REF IN
WENZEL
OSCILLATOR
EVALUATION BOARD
AD9514
CLK1
OUT1
OUT1B
TERM
TERM
ANALOG
SOURCE
CLK
ADC
DATA CAPTURE CARD
FIFO
Figure 42. Jitter Determination by Measuring SNR of ADC
PC
SNR
FFT
t_{J_RMS}
t _{J_RMS} =
( ^{⎢⎡VA_RMS}
⎢ ^SNR
⎤²
⎥
⎥
−
SND ×
⎣ 10 ²⁰ ⎦
) ( ) BW
− θ + θ + θ ²
2
2
2
QUANTIZATION
THERMAL
DNL
[ ] 2π × f _A ×V_{A_PK} ²
where:
tj_RMS is the rms time jitter.
SNR is the signal-to-noise ratio.
SND is the source noise density in nV/√Hz.
BW is the SND filter bandwidth.
VA is the analog source voltage.
fA is the analog frequency.
The θ terms are the quantization, thermal, and DNL errors.
Rev. 0 | Page 27 of 28