5962-91764 Datasheet, PDF (13/15 Pages) Analog Devices – MICROCIRCUIT, DIGITAL-LINEAR, 12-BIT, QUAD

4.4.1 Group A inspection.
a. Tests shall be as specified in table II herein.
b. Subgroups 5, 6, and 8 in table I, method 5005 of MIL-STD-883 shall be omitted.
c. For device class M, subgroups 7 tests shall be sufficient to verify the truth table. For device classes Q and V,
subgroups 7 shall include verifying the functionality of the device.
TABLE II. Electrical test requirements.
Test requirements
Interim electrical
parameters (see 4.2)
Final electrical
parameters (see 4.2)
Group A test
requirements (see 4.4)
Group C end-point electrical
parameters (see 4.4)
Group D end-point electrical
parameters (see 4.4)
Group E end-point electrical
parameters (see 4.4)
Subgroups
(in accordance with
MIL-STD-883,
method 5005, table I)
Device
class M
1
Subgroups
(in accordance with
MIL-PRF-38535, table III)
Device
class Q
1
Device
class V
1
1, 2, 3 1/
1, 2, 3 1/
1, 2, 3 1/
1, 2, 3, 4, 7, 9, 10, 11 1, 2, 3, 4, 7, 9, 1, 2, 3, 4, 7, 9,
2/
10, 11 2/
10, 11 2/
1
1
1
1
1
1
---
---
---
1/ PDA applies to subgroup 1.
2/ Subgroups 4, 9, 10, and 11, not tested, but shall be guaranteed to the limits specified in table I herein.
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
a. Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of
MIL-STD-883.
b. TA = +125°C, minimum.
c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-
STD-883.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
B
5962-91764
SHEET
13