English
Language : 

ADIS16204_15 Datasheet, PDF (1/24 Pages) Analog Devices – Programmable High-g Digital Impact Sensor and Recorder
Programmable High-g Digital
Impact Sensor and Recorder
ADIS16204
FEATURES
FUNCTIONAL BLOCK DIAGRAM
Dual-axis sensing, ±70 g, ±37 g
AUX AUX
ADC DAC VREF
14-bit resolution
ADIS16204
Impact peak-level sample-and-hold
RSS output
TEMPERATURE
SENSOR
Programmable event recorder
400 Hz double-pole Bessel sensor response
Digitally controlled sensitivity and bias
Digitally controlled sample rate, up to 4096 SPS
Programmable condition monitoring alarms
Auxiliary digital I/O
E Digitally activated self-test
Embedded temperature sensor
Programmable power management
T SPI-compatible serial interface
Auxiliary 12-bit ADC input and DAC output
Single-supply operation: +3.0 V to +3.6 V
4000 g powered shock survivability
E APPLICATIONS
Crash or impact detection
L Condition monitoring of valuable goods
Safety, shut-off sensing
Impact event recording
Security sensing, tamper detection
O GENERAL DESCRIPTION
The ADIS16204 is a fully-contained programmable impact
sensor in a single compact package enabled by the Analog
S Devices, Inc. iSensor™ integration. By enhancing the Analog
Devices iMEMS® sensor technology with an embedded signal
processing solution, the ADIS16204 provides tunable digital
sensor data in a convenient format that can be accessed using
B a serial peripheral interface (SPI). The SPI provides access to
measurements for dual-axis linear acceleration, a root sum
square (RSS) of both axes, temperature, power supply, an
O auxiliary analog input, and an event capture buffer memory. Easy
VDD
COM
INERTIAL
MEMS
SENSOR
SELF-TEST
SIGNAL
CONDITIONING
AND
CONVERSION
DIGITAL
PROCESSING
DIGITAL
CONTROL
SPI
PORT
CS
SCLK
DIN
DOUT
POWER
MANAGEMENT
ALARMS
AUXILIARY
I/O
EVENT
CAPTURE
BUFFER
MEMORY
RST
Figure 1.
DIO1 DIO2
The ADIS16204 offers the following embedded features, which
eliminate the need for external circuitry and provide a simplified
system interface:
 Peak sample-and-hold
 Programmable event recording (dual, 1K × 16 bit)
 RSS output (total shock in the XY plane)
 Configurable alarms
 Auxiliary 12-bit ADC and DAC
 Configurable digital I/O port
access to digital sensor data provides users with a system-ready
device, reducing development time, cost, and program risk.
 Digital self-test function
Unique characteristics of the end system are accommodated
easily through several built-in features, such as a single command
in-system bias null/offset calibration, along with convenient
The ADIS16204 offers two power management features for
managing system-level power dissipation: low power mode
and a configurable shutdown feature.
sample rate control.
The ADIS16204 is available in a 9.2 mm × 9.2 mm × 3.9 mm
laminate-based land grid array (LGA) package with a tem-
perature range of −40°C to +105°C.
Rev. B
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Fax: 781.461.3113 ©2007–2009 Analog Devices, Inc. All rights reserved.