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AD5522 Datasheet, PDF (1/45 Pages) Analog Devices – Quad Parametric Measurement Unit With Integrated 16-Bit Level Setting DACs
Preliminary Technical Data
Quad Parametric Measurement Unit With
Integrated 16-Bit Level Setting DACs
AD5522
FEATURES
Quad Parametric Measurement Unit
FV, FI, FN, MV, MI Functions
4 Programmable Current Ranges (Internal RSENSE)
5uA, 20uA, 200uA and 2mA
1 Programmable Current Range up to 64mA (external RSENSE)
22.5 V FV Range with Asymmetrical Operation
Integrated 16-Bit DACs Provide Programmable Levels
Offset and Gain Correction on Chip
Low Capacitance Outputs Suited to Relay Less Systems
On-chip Comparators Per Channel
FI Voltage Clamps & FV Current Clamps
Guard Drive Amplifier
System PMU connections
Programmable Temperature Shutdown Feature
SPI/Microwire/DSP & LVDS Compatible Interfaces
Compact 80 lead TQFP Package with Exposed Pad (Top Or
Bottom)
APPLICATIONS
Automatic Test Equipment (ATE)
per pin Parametric Measurement Unit
Continuity & Leakage Testing
Device Power Supply
Instrumentation
SMU (Source Measure Unit)
Precision Measurement
AGND AVSS(0-4) AVDD(0-4) DVCC DGND
PRODUCT OVERVIEW
The AD5522 is a high performance, highly integrated parametric
measurement unit consisting of four independent channels. Each
PPMU channel includes five, 16-bit, voltage out DACs setting the
programmable inputs levels for the force voltage input, clamp and
comparator inputs (high and low). Five programmable force and
measure current ranges are available ranging from 5µA to 64mA.
Four of these ranges use on chip sense resistors, while a high
current range up to 64mA is available per channel using off chip
sense resistors. Currents in excess of 64mA require an external
amplifier. Low capacitance DUT connections (FOH, EXT FOH)
ensure the device is suited to relay less test systems.
The PMU functions are controlled via a simple three wire serial
interface compatible with SPI/QSPI/Microwire and DSP interface
standards. Interface clocks of 50MHz allow fast updating of modes.
LVDS (Low Voltage Differential Signaling) interface protocol at
100MHz is also supported. Comparator outputs are provided per
channel for device go no-go testing and characterization. Control
registers provide easy way of changing force or measure conditions,
DAC levels and selected current ranges. SDO (serial data out)
allows the user to readback information for diagnostic purposes.
CCOMP (0-3)
SYS_FORCE SYS_SENSE
VREF
REFGND
MEASOUT (0-3)
AGND (0-3)
16
X1 REG
16
M REG
16
C REG *2
X2 REG
*2
16-Bit
16 CLH DAC
OFFSET DAC
x4
CLH
EN
SW 3
16
16
16
X1 REG
M REG
C REG
*6
16
16
X1 REG
M REG
16
C REG *2
*6
16-Bit
16 FIN DAC
X2 REG
X2 REG
*2
16 16-Bit
CLL DAC
FIN
SW 1
AGNDx
+
FORCE
AMPLIFER
-
SW 2
CLL
OFFSET DAC
BIAS TO
+
SW 10
CENTER
-
IRANGE
INTERNAL RANGE SELECT
(5uA, 20uA, 200uA, 2mA) 60Ω 1kΩ
RSENSE
SW 4
SW 6
SW 5
SW 7
SW 8
10kΩ
+
SW 12
MEASOUT
MUX & GAIN
x1/x0.2
TEMP
SENSOR
16
*6
16
16
X1 REG
M REG
C REG
*6
16-Bit
X2 REG 16 CPH DAC
SW 11
x5 or x10
-
+
-
MEASURE
CURRENT
IN AMP
+
-
AGNDx +
16
16
*6
16
X1 REG
M REG
C REG
*6
16-Bit CPL
16 CPL DAC
X2 REG
-+
COM PARATO R
CPH
-+
x1
-
MEASURE
VOLTAGE
IN AMP
+ DUTGND
-
SW 9
SW 13
SW 14
SW 16
GUARD AMP
SW 15
10kΩ
AGNDx
16-Bit
16 OFFSET
DAC
16
POWER ON
RESET
TO ALL DAC
OUTPUT
AMPLIFIERS
SERIAL
INTERFACE
TO
MEASOUT
MUX
TEMP
SENSOR
CLAMP &
GUARD
ALARM
EXTFOH(0-3)
CFF(0-3)
FOH(0-3)
EXTMEASIH(0-3)
EXTMEASIL(0-3)
EXTERNAL
RSENSE
(CURRENTS
UP TO 64mA)
MEASVH (0-3)
GUARD (0-3)
GUARDIN (0-3)/
DUTGND (0-3)
DUTGND
DUT
TMPALM
CGALM
RESET
SDO SCLK SDI SYNC BUSY LOAD LVDS/ CPOL0/ CPOH0/
SPI SCLK SDI
CPOL1/ CPOH1/ CPOL2 CPOH2 CPOL3 CPOH3
SYNC SDO
/CPO0 /CPO1 /CPO2 /CPO3
Figure 1. Functional Block Diagram
Rev.PrL
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