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COREDES-XX Datasheet, PDF (1/12 Pages) Actel Corporation – CoreDES
CoreDES
Product Summary
Intended Use
• Whenever Data is Transmitted across an Accessible
Medium (Wires, Wireless, etc.)
• E-Commerce Transactions, where Dedicated
Encryption/Decryption Hardware Can Ease the
Load on Servers
• Personal Security Devices
• Bank Transactions, where Financial Security is
Mandatory
Key Features
• 56-bit Cipher Key (with 8 Additional Parity Bits)
• Parity Checking Logic for Cipher Key
• Encryption and Decryption Possible with Same
Core
• 16-Clock Cycle Operation to Encrypt or Decrypt 64
Bits of Data
• Pause/Resume Functionality to Continue
Encryption or Decryption at Will
• Compliant with FIPS PUB 46-3
• ECB (Electronic Codebook) Implementation per
FIPS PUB 81
• Example Source Code Provided for CBC, CFB and
OFB Modes
• Provides Data Security within a Secure Actel FPGA
• All Major Actel Device Families Supported
Supported Families
• Fusion
• ProASIC3/E
• ProASICPLUS
• Axcelerator
• RTAX-S
• SX-A
• RTSX-S
Core Deliverables
• Evaluation Version
– Compiled RTL Simulation Model Fully
Supported in the Actel Libero® Integrated
Design Environment (IDE)
• Netlist Version
– Structural Verilog and VHDL Netlists (with and
without I/O pads) Compatible with the Actel
Designer Place-and-Route Software Tool
– Compiled RTL Simulation Model Fully
Supported in the Actel Libero IDE
• RTL Version
– Verilog or VHDL Core Source Code
– Core Synthesis Scripts
• Actel-Developed Testbench (Verilog and VHDL)
Synthesis and Simulation Support
• Synthesis: Synplicity®, Synopsys® (Design
Compiler® / FPGA Compiler™ / FPGA Express™),
Exemplar™
• Simulation: OVI-Compliant Verilog Simulators and
Vital-Compliant VHDL Simulators
Core Verification
• Actel-Developed Simulation Testbench Verifies
CoreDES against Tests Listed in the National
Institute of Standards and Technology (NIST)
Special Publication 800-17, Modes of Operation
Validation System (MOVS): Requirements and
Procedures
• Users Can Easily Modify Testbench Using Existing
Format to Add More Tests Listed in NIST Special
Publication 800-17 or Custom Tests
December 2005
v4.0
1
© 2005 Actel Corporation