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ACE701D Datasheet, PDF (1/14 Pages) ACE Technology Co., LTD. – PFM STEP-UP DC/DC Converter with High Efficiency and Low Noise
ACE701D
PFM STEP-UP DC/DC Converter with High Efficiency and Low Noise
Description
The ACE701D series are CMOS-based PFM step-up DC-DC Converter. The converter can start up by
supply voltage as low as 0.8V, and capable of delivering maximum 200mA output current at 3.3V output
with 1.8V input Voltage. Quiescent current drawn from power source is as low as 5.5uA. All of these
features make ACE701D series be suitable for the portable devices, which are supplied by a single
battery to four-cell batteries.
To reduce the noise caused by the switch regulator, ACE701D is well considerate in circuit design and
manufacture. So that the interferer to other circuits by the device is reduced greatly.
ACE701D integrates stable reference circuits and trimming technology, so it can afford high precision
and low temperature-drift coefficient of the output voltage.
Features
 Deliver 200mA at 3.3V Output voltage with 1.8V input Voltage
 Low start-up voltage (when the output current is 1mA) 0.8V
 The converter output voltage can be adjusted from 2.5V~6.0V(In 0.1V step)
 Output voltage accuracy 2%
 Low temperature-drift coefficient of the output voltage 100ppm/℃
 Only three external components are necessary: An inductor, a Schottky diode and an output filter
capacitor
 High power conversion efficiency 85%
 Low quiescent current drawn from power source <5.5uA
Application
 Power source for PDA. DSC. MP3 Player. electronic toy and wireless mouse
 Power source for a single or dual-cell battery-powered equipments
 Power source for LED
Absolute Maximum Ratings
Parameter
Symbol Max Unit
Input supply voltage
VIN
-0.3~12 V
Lx Voltage
-0.3~6.5 V
CE pin voltage
-0.3~Vout+0.3 V
Lx pin output current
Power Dissipation
SOT-89-3
SOT-23-5
SOT-23-3L
TO-92
Operating Junction temperature TJ
0.7
A
500
250
mW
250
500
125
OC
Storage temperature
TS - 40 to 150 OC
Ambient Temperature
TA
-40 to 85 OC
Note: Exceed these limits to damage to the device.
Exposure to absolute maximum rating conditions may affect device reliability.
VER 1.3 1