ACE504A Datasheet, PDF (1/12 Pages) ACE Technology Co., LTD. – Wide Input Voltage Range, 150mA ULDO Regulator

Technology
ACE504A
Wide Input Voltage Range, 150mA ULDO Regulator
Description
ACE504A series are positive voltage regulator IC fabricated by high voltage EPNP process.
The ACE504A has features of wide input voltage range and high accuracy, high ripple rejection, low
dropout voltage, low noise, current limit and ultra-low quiescent current which make them ideal for use in
various USB and portable device.
The IC consists of a voltage reference, an error amplifier, a resistor network for setting output voltage, a
current limit circuit for current protection, and a chip enable circuit.
ACE504A has adjustable, 1.8V,3.3V,5.0V fixed voltage versions.
The ACE504A is available in space saving SOT-23-5 an SOT-89-3 packages.
Features
• Wide Input Voltage Range: 2.3V to 24V
• Wide Output Voltage Range: 1.24V to 22V
• Excellent Ripple Rejection: 60dB@ f=1kHz
• Low Dropout Voltage: V_DROP=100mV@I_OUT=100μA
• Low Ground Current
• High Output Voltage Accuracy
• Compatible with Low ESR Ceramic Capacitor
• Excellent Line/ Load Regulation
• Thermal Shutdown Function
Application
• Battery Powered equipment
• Laptop, Palmtops, Notebook Computers
• Portable Information Appliances
Absolute Maximum Ratings
Parameter
Symbol
Max
Unit
Supply Input voltage
VIN
38
V
Enable Input Voltage
Output Current
Lead Temperature (Soldering, 10sec)
Operating Junction Temperature
ESD (Machine Mode)
ESD (Human Body Mode)
Storage Temperature Range
Thermal Resistance (No Heatsink)
V_CE
I_OUT
T_LEAD
T_J
T_LEAD
θ_JA
38
250
260
150
275
2000
-60 to 150
SOT-23-5 ₂₅₀
SOT-89-3 ₁₆₅
V
mA
℃
℃
V
V
℃
℃/W
Note 1: Stressed greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated
under “ Recommended Operating Conditions” is not implied. Exposure to “Absolute Maximum Ratings” for extended periods may
affect device reliability.
VER 1.2 1